Growth and characterization of vacuum deposited stoichiometric films of sulphide semiconductors

dc.contributor.guideSingh, Beer palen_US
dc.coverage.spatialPhysicsen_US
dc.creator.researcherRakesh Kumaren_US
dc.date.accessioned2015-02-16T11:05:24Z
dc.date.available2015-02-16T11:05:24Z
dc.date.awardedn.d.en_US
dc.date.completed2013en_US
dc.date.issued2015-02-16
dc.date.registeredn.d.en_US
dc.description.abstractNone newlineen_US
dc.description.noteConclusion p,175-183,en_US
dc.format.accompanyingmaterialNoneen_US
dc.format.dimensions30cmen_US
dc.format.extentxi, 186p,en_US
dc.identifier.urihttp://hdl.handle.net/10603/35332
dc.languageEnglishen_US
dc.publisher.institutionDepartment of Physicsen_US
dc.publisher.placeMeeruten_US
dc.publisher.universityChaudhary Charan Singh Universityen_US
dc.relationNoneen_US
dc.rightsuniversityen_US
dc.source.universityUniversityen_US
dc.subject.keywordGrowthen_US
dc.subject.keywordCharacterizationen_US
dc.subject.keywordDeposited Stoichiometricen_US
dc.subject.keywordSulphide Semiconductorsen_US
dc.titleGrowth and characterization of vacuum deposited stoichiometric films of sulphide semiconductorsen_US
dc.title.alternativeen_US
dc.type.degreePh.D.en_US

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