Study of electrical and structural properties of metal contacts on gallium nitride

dc.contributor.guideRajagopal Reddy, V
dc.coverage.spatialElectronics
dc.creator.researcherRamesha Reddy, N
dc.date.accessioned2016-05-24T10:47:35Z
dc.date.available2016-05-24T10:47:35Z
dc.date.awardedn.d.
dc.date.completed2007
dc.date.registeredn.d.
dc.description.abstractAbstract available newline newline
dc.description.note-
dc.format.accompanyingmaterialDVD
dc.format.dimensions-
dc.format.extentxii, 111p.
dc.identifier.urihttp://hdl.handle.net/10603/91949
dc.languageEnglish
dc.publisher.institutionDepartment of Electronics
dc.publisher.placeMysore
dc.publisher.universityUniversity of Mysore
dc.relation-
dc.rightsuniversity
dc.source.universityUniversity
dc.subject.keywordGaN material system, Metal-semiconductor, Schottky-Mott model, Electron beam, Rapid thermal annealing
dc.titleStudy of electrical and structural properties of metal contacts on gallium nitride
dc.title.alternative-
dc.type.degreePh.D.

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