Studies on preparation and characterization of mgf2 and yf5 multilayer antireflection thin films

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dc.contributor.guideKistaiah Pen_US
dc.coverage.spatialen_US
dc.creator.researcherAtchaiah Naidu Ven_US
dc.date.accessioned2014-07-11T10:42:59Z
dc.date.available2014-07-11T10:42:59Z
dc.date.awarded07/06/2014en_US
dc.date.completed20/01/2014en_US
dc.date.issued2014-07-11
dc.date.registered21/02/2009en_US
dc.description.abstractnewlineen_US
dc.description.noteen_US
dc.format.accompanyingmaterialDVDen_US
dc.format.dimensionsen_US
dc.format.extent178pen_US
dc.identifier.urihttp://hdl.handle.net/10603/20728
dc.languageEnglishen_US
dc.publisher.institutionDepartment of Physicsen_US
dc.publisher.placeHyderabaden_US
dc.publisher.universityOsmania Universityen_US
dc.relationen_US
dc.rightsuniversityen_US
dc.source.universityUniversityen_US
dc.subject.keywordantireflection thin filmen_US
dc.titleStudies on preparation and characterization of mgf2 and yf5 multilayer antireflection thin filmsen_US
dc.title.alternativeen_US
dc.type.degreePh.D.en_US

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