Machine Learning Approaches for Reliability and Design Optimization in Ultra Large Scale Integrated Circuits
| dc.contributor.guide | Kalra, Shruti | |
| dc.coverage.spatial | ||
| dc.creator.researcher | Singh, Karan | |
| dc.date.accessioned | 2025-04-09T11:24:46Z | |
| dc.date.available | 2025-04-09T11:24:46Z | |
| dc.date.awarded | 2025 | |
| dc.date.completed | 2025 | |
| dc.date.registered | 2020 | |
| dc.description.abstract | included newline | |
| dc.description.note | ||
| dc.format.accompanyingmaterial | None | |
| dc.format.dimensions | ||
| dc.format.extent | xxiv, 162p.,Synopsis-23p. | |
| dc.identifier.researcherid | 0000-0002-1452-7976 | |
| dc.identifier.uri | http://hdl.handle.net/10603/632635 | |
| dc.language | English | |
| dc.publisher.institution | Department of Electronics and Communication Engineering | |
| dc.publisher.place | Noida | |
| dc.publisher.university | Jaypee Institute of Information Technology | |
| dc.relation | ||
| dc.rights | university | |
| dc.source.university | University | |
| dc.subject.keyword | Accelerated lifetime testing | |
| dc.subject.keyword | Electronics and Communication Engineering | |
| dc.subject.keyword | Engineering | |
| dc.subject.keyword | Engineering and Technology | |
| dc.subject.keyword | Engineering Electrical and Electronic | |
| dc.subject.keyword | Machine learning-based approach, | |
| dc.subject.keyword | NBTI, HSPICE. | |
| dc.subject.keyword | Prediction of reliability | |
| dc.title | Machine Learning Approaches for Reliability and Design Optimization in Ultra Large Scale Integrated Circuits | |
| dc.title.alternative | ||
| dc.type.degree | Ph.D. |
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