Machine Learning Approaches for Reliability and Design Optimization in Ultra Large Scale Integrated Circuits

dc.contributor.guide	Kalra, Shruti
dc.coverage.spatial
dc.creator.researcher	Singh, Karan
dc.date.accessioned	2025-04-09T11:24:46Z
dc.date.available	2025-04-09T11:24:46Z
dc.date.awarded	2025
dc.date.completed	2025
dc.date.registered	2020
dc.description.abstract	included newline
dc.description.note
dc.format.accompanyingmaterial	None
dc.format.dimensions
dc.format.extent	xxiv, 162p.,Synopsis-23p.
dc.identifier.researcherid	0000-0002-1452-7976
dc.identifier.uri	http://hdl.handle.net/10603/632635
dc.language	English
dc.publisher.institution	Department of Electronics and Communication Engineering
dc.publisher.place	Noida
dc.publisher.university	Jaypee Institute of Information Technology
dc.relation
dc.rights	university
dc.source.university	University
dc.subject.keyword	Accelerated lifetime testing
dc.subject.keyword	Electronics and Communication Engineering
dc.subject.keyword	Engineering
dc.subject.keyword	Engineering and Technology
dc.subject.keyword	Engineering Electrical and Electronic
dc.subject.keyword	Machine learning-based approach,
dc.subject.keyword	NBTI, HSPICE.
dc.subject.keyword	Prediction of reliability
dc.title	Machine Learning Approaches for Reliability and Design Optimization in Ultra Large Scale Integrated Circuits
dc.title.alternative
dc.type.degree	Ph.D.