Search strategies to solve certain problems of VLSI system design and testing

dc.contributor.guide	Maulik, U; Bandyopadhyay, S; Chakraborty, S
dc.coverage.spatial	Computer Science and Engineering
dc.creator.researcher	Roy, Samir
dc.date.accessioned	2018-08-03T08:47:27Z
dc.date.available	2018-08-03T08:47:27Z
dc.date.awarded	n.d.
dc.date.completed	2002
dc.date.registered	n.d.
dc.description.abstract	Abstract available
dc.description.note	Data not available
dc.format.accompanyingmaterial	None
dc.format.dimensions	29cm.
dc.format.extent	xiv, 159p.
dc.identifier.uri	http://hdl.handle.net/10603/211075
dc.language	English
dc.publisher.institution	Computer Science and Engineering
dc.publisher.place	Kalyani
dc.publisher.university	University of Kalyani
dc.relation	141-157
dc.rights	university
dc.source.university	University
dc.subject.keyword	BIST
dc.subject.keyword	Elitism
dc.subject.keyword	Mutation
dc.subject.keyword	Pseudo-Random
dc.subject.keyword	VLSI
dc.title	Search strategies to solve certain problems of VLSI system design and testing
dc.title.alternative
dc.type.degree	Ph.D.