Structural, optical and electrical characterization of indium tin oxide and aluminum nitride thin films for gas sensing application

dc.contributor.guide	Vijayalakshmi, K	en_US
dc.coverage.spatial	Physics	en_US
dc.creator.researcher	Vasanthi Pillay, V	en_US
dc.date.accessioned	2013-07-03T06:47:12Z
dc.date.available	2013-07-03T06:47:12Z
dc.date.awarded	n.d.	en_US
dc.date.completed	2012	en_US
dc.date.issued	2013-07-03
dc.date.registered	n.d.	en_US
dc.description.abstract	None	en_US
dc.description.note	References p.235-252	en_US
dc.format.accompanyingmaterial	None	en_US
dc.format.dimensions	-	en_US
dc.format.extent	252p.	en_US
dc.identifier.uri	http://hdl.handle.net/10603/9655
dc.language	English	en_US
dc.publisher.institution	Department of Physics	en_US
dc.publisher.place	Tiruchirappalli	en_US
dc.publisher.university	Bharathidasan University	en_US
dc.relation	266	en_US
dc.rights	university	en_US
dc.source.inflibnet	INFLIBNET	en_US
dc.subject.keyword	Physics	en_US
dc.subject.keyword	indium tin oxide	en_US
dc.subject.keyword	aluminum nitride	en_US
dc.subject.keyword	gas sensing application	en_US
dc.title	Structural, optical and electrical characterization of indium tin oxide and aluminum nitride thin films for gas sensing application	en_US
dc.title.alternative	-	en_US
dc.type.degree	Ph.D.	en_US