Characterization of latice imperfections in nanocrystalline materials by position annihilation, xray diffraction and other methods

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dc.contributor.guidePradhan, Swapan Kren_US
dc.coverage.spatialPhysicsen_US
dc.creator.researcherAbhijit Banerjeeen_US
dc.date.accessioned2014-08-04T08:15:26Z
dc.date.available2014-08-04T08:15:26Z
dc.date.awarded02/04/2013en_US
dc.date.completedn.d.en_US
dc.date.issued2014-08-04
dc.date.registered4-10-2005en_US
dc.description.abstractNoneen_US
dc.description.note-en_US
dc.format.accompanyingmaterialNoneen_US
dc.format.dimensions-en_US
dc.format.extent-en_US
dc.identifier.urihttp://hdl.handle.net/10603/22084
dc.languageEnglishen_US
dc.publisher.institutionDepartment of Physicsen_US
dc.publisher.placeBardhamanen_US
dc.publisher.universityThe University of Burdwanen_US
dc.relation-en_US
dc.rightsuniversityen_US
dc.source.universityUniversityen_US
dc.subject.keywordPhysicsen_US
dc.titleCharacterization of latice imperfections in nanocrystalline materials by position annihilation, xray diffraction and other methodsen_US
dc.title.alternative-en_US
dc.type.degreePh.D.en_US

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