Studies on electronic speckle pattern interferometry ESPI for non destructive evaluation

dc.contributor.guideUnnikrishnan Nayar V; Ravindran V R
dc.coverage.spatial
dc.creator.researcherMujeeb A
dc.date.accessioned2016-08-19T11:48:00Z
dc.date.available2016-08-19T11:48:00Z
dc.date.awarded
dc.date.completed21/07/2006
dc.date.registered21/07/2002
dc.description.abstractnewline
dc.description.note
dc.format.accompanyingmaterialNone
dc.format.dimensions
dc.format.extent
dc.identifier.urihttp://hdl.handle.net/10603/107544
dc.languageEnglish
dc.publisher.institutionDepartment of Optoelectronics
dc.publisher.placeThiruvananthapuram
dc.publisher.universityUniversity of Kerala
dc.relation
dc.rightsuniversity
dc.source.universityUniversity
dc.subject.keywordOptoelectronics
dc.titleStudies on electronic speckle pattern interferometry ESPI for non destructive evaluation
dc.title.alternative
dc.type.degreePh.D.

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