Studies on electronic speckle pattern interferometry ESPI for non destructive evaluation
| dc.contributor.guide | Unnikrishnan Nayar V; Ravindran V R | |
| dc.coverage.spatial | ||
| dc.creator.researcher | Mujeeb A | |
| dc.date.accessioned | 2016-08-19T11:48:00Z | |
| dc.date.available | 2016-08-19T11:48:00Z | |
| dc.date.awarded | ||
| dc.date.completed | 21/07/2006 | |
| dc.date.registered | 21/07/2002 | |
| dc.description.abstract | newline | |
| dc.description.note | ||
| dc.format.accompanyingmaterial | None | |
| dc.format.dimensions | ||
| dc.format.extent | ||
| dc.identifier.uri | http://hdl.handle.net/10603/107544 | |
| dc.language | English | |
| dc.publisher.institution | Department of Optoelectronics | |
| dc.publisher.place | Thiruvananthapuram | |
| dc.publisher.university | University of Kerala | |
| dc.relation | ||
| dc.rights | university | |
| dc.source.university | University | |
| dc.subject.keyword | Optoelectronics | |
| dc.title | Studies on electronic speckle pattern interferometry ESPI for non destructive evaluation | |
| dc.title.alternative | ||
| dc.type.degree | Ph.D. |
Files
Original bundle
1 - 5 of 14
Loading...
- Name:
- 01_title.pdf
- Size:
- 20.14 KB
- Format:
- Adobe Portable Document Format
- Description:
- Attached File
Loading...
- Name:
- 02_certificate & declaration.pdf
- Size:
- 52.81 KB
- Format:
- Adobe Portable Document Format
Loading...
- Name:
- 04_acknowledgement.pdf
- Size:
- 75.09 KB
- Format:
- Adobe Portable Document Format
License bundle
1 - 1 of 1