Some Investigations on Efficient Testing  Fault Diagnosis Algorithms for VLSI Circuits

dc.contributor.guide	Rao, P Sreehari and Jahagirdar, D R
dc.coverage.spatial
dc.creator.researcher	Rayudu, K V B V
dc.date.accessioned	2022-12-28T12:26:04Z
dc.date.available	2022-12-28T12:26:04Z
dc.date.awarded	2022
dc.date.completed	2022
dc.date.registered
dc.description.abstract	Attached
dc.description.note
dc.format.accompanyingmaterial	None
dc.format.dimensions
dc.format.extent	xvi, 78p.
dc.identifier.uri	http://hdl.handle.net/10603/433113
dc.language	English
dc.publisher.institution	Department of Electronics and Communication Engineering
dc.publisher.place	Warangal
dc.publisher.university	National Institute of Technology Warangal
dc.relation
dc.rights	university
dc.source.university	University
dc.subject.keyword	Efficient Testing
dc.subject.keyword	Engineering
dc.subject.keyword	Engineering and Technology
dc.subject.keyword	Engineering Electrical and Electronic
dc.subject.keyword	Fault Diagnosis
dc.subject.keyword	VLSI Circuits
dc.title	Some Investigations on Efficient Testing Fault Diagnosis Algorithms for VLSI Circuits
dc.title.alternative	Some Investigations on Efficient Testing and Fault Diagnosis Algorithms for VLSI Circuits
dc.type.degree	Ph.D.