Investigations on automated test data generation techniques with special reference to loops and infeasible paths

dc.contributor.guideKalita, Bichitraen_US
dc.coverage.spatialComputer Sciencesen_US
dc.creator.researcherHitesh Tahbildaren_US
dc.date.accessioned2012-12-14T07:22:15Z
dc.date.available2012-12-14T07:22:15Z
dc.date.awardedn.d.en_US
dc.date.completedn.d.en_US
dc.date.issued2012-12-14
dc.date.registeredn.d.en_US
dc.description.abstractIncludeden_US
dc.description.noteSummary p. 129-135, List of publications p. 136-144, References p. 145-154en_US
dc.format.accompanyingmaterialNoneen_US
dc.format.dimensions--en_US
dc.format.extent154p.en_US
dc.identifier.urihttp://hdl.handle.net/10603/5503
dc.languageEnglishen_US
dc.publisher.institutionDepartment of Computer Science and Applicationen_US
dc.publisher.placeGuwahatien_US
dc.publisher.universityGauhati Universityen_US
dc.relationNo. of references 80en_US
dc.rightsuniversityen_US
dc.source.inflibnetINFLIBNETen_US
dc.subject.keywordComputer Sciencesen_US
dc.subject.keywordAutomated Test Data Generation Techniquesen_US
dc.titleInvestigations on automated test data generation techniques with special reference to loops and infeasible pathsen_US
dc.title.alternativeen_US
dc.type.degreePh.D.en_US

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