Investigation of codoped hafnia thin films for device applications

dc.contributor.guideRao, Mohan K
dc.coverage.spatialPhysics
dc.creator.researcherSabhya
dc.date.accessioned2025-02-10T05:54:38Z
dc.date.available2025-02-10T05:54:38Z
dc.date.awarded2024
dc.date.completed2024
dc.date.registered2021
dc.description.abstractAvailable newline
dc.description.notebibliography p.206-212
dc.format.accompanyingmaterialNone
dc.format.dimensions-
dc.format.extent222p.
dc.identifier.researcherid
dc.identifier.urihttp://hdl.handle.net/10603/620983
dc.languageEnglish
dc.publisher.institutionManipal Institute of Technology
dc.publisher.placeManipal
dc.publisher.universityManipal Academy of Higher Education
dc.relationNo.of references 97
dc.rightsuniversity
dc.source.universityUniversity
dc.subject.keywordHfO2 films
dc.subject.keywordMOS Capacitors, Spin coating
dc.subject.keywordOxygen vacancies
dc.titleInvestigation of codoped hafnia thin films for device applications
dc.title.alternative-
dc.type.degreePh.D.

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